Publication Details

Author:K. Davut, S. Zaefferer
Title:The Reliability of EBSD-based Microstructure Analysis
Category:Articles
Index:Science Citation Index
Published Place:Microscopy & Microanalysis (Conference special issue)
Year:2015
Volume:21 (S3)
Pages:pp. 2269-2270
Place:Portland, OR, USA
URLhttp://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=9917529&fileId=S1431927615010922