Publication Details

Author:K. Davut, S. Zaefferer
Title:Improving the Reliability of EBSD-based Texture Analysis by a New Large Area Mapping Technique
Category:International Refereed Journal
Index:Others
Published Place:Materials Science Forum
Year:2012
Volume:702-703
Pages:pp. 566-569
Place:
URLhttp://www.scientific.net/MSF.702-703.566